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SEM, TEM, and AFM for Nanomaterial Analysis

AttributeDetail
FormatOnline, self-paced course
LevelBasic / Beginner
Duration2–3 Weeks
Certificatione-Certification
Fee₹199 / $20
ToolsSEM TEM AFM Nanomaterial Characterization Microscopy Analysis

About the SEM, TEM, and AFM for Nanomaterial Analysis Course

The SEM, TEM, and AFM for Nanomaterial Analysis course is a free, beginner-friendly self-paced program designed to introduce learners to key microscopy techniques used for studying nanomaterials.

The course explains how Scanning Electron Microscopy, Transmission Electron Microscopy, and Atomic Force Microscopy help analyze nanoscale size, shape, surface structure, morphology, and material features. Learners will understand the basic working principles, applications, and differences between these techniques.

Program Highlights

• Free beginner-level microscopy course

• Online self-paced learning format

• Simple explanation of SEM, TEM, and AFM concepts

• Covers nanomaterial morphology and surface analysis basics

• Real-world examples from nanotechnology and materials research

• Suitable for students and first-time learners

• e-Certification upon successful completion

Course Curriculum

Module 1: Introduction to Nanomaterial Microscopy

  • What is Nanomaterial Analysis?
  • Why Microscopy is Important in Nanotechnology
  • Overview of SEM, TEM, and AFM
  • Applications in Research and Industry

Module 2: Scanning Electron Microscopy Basics

  • What is SEM?
  • Basic Working Principle of SEM
  • Surface Morphology and Imaging Concepts
  • Applications of SEM in Nanomaterial Analysis

Module 3: Transmission Electron Microscopy Basics

  • What is TEM?
  • Basic Working Principle of TEM
  • Internal Structure and High-Resolution Imaging
  • Applications of TEM in Nanoscience Research

Module 4: Atomic Force Microscopy Basics

  • What is AFM?
  • Surface Topography and Probe-Based Imaging
  • Understanding Roughness and Nanoscale Surface Features
  • Applications of AFM in Material Characterization

Module 5: Comparison and Applications

  • SEM vs TEM vs AFM
  • Choosing the Right Microscopy Technique
  • Interpreting Microscopy Images at a Basic Level
  • Mini Learning Activity / Concept-Based Practice

Tools, Techniques, or Platforms Covered

SEM TEM AFM Nanomaterial Characterization Microscopy Analysis

Real-World Applications

  • Studying nanoparticle size and shape
  • Analyzing surface morphology of nanomaterials
  • Observing internal structure of nanoscale materials
  • Understanding surface roughness and texture
  • Supporting nanotechnology, materials science, and biomedical research

Who Should Attend & Prerequisites

  • This course is suitable for students, beginners, science learners, engineering learners, nanotechnology learners, materials science learners, and researchers interested in nanomaterial microscopy.
  • It is also useful for learners from physics, chemistry, materials science, nanotechnology, biotechnology, biomedical science, and engineering backgrounds.
Prerequisites: No prior microscopy or nanomaterial analysis knowledge is required. Basic understanding of science or interest in laboratory characterization is helpful but not mandatory.

Certification

Sample certificate
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